欢迎本科生、硕博研究生、博士后加入课题组。提供全面的数字芯片研发环境，包括设计、流片、测试等关键流程。给予系统性的学术训练以及良好融洽的团队氛围。有兴趣者请邮件联系。
研究方向：
1、高可靠智能算法及其专用加速芯片
2、面向AI数据中心的低温（77K）大算力芯片
3、智能医疗微系统芯片
教育背景：
复旦大学，微电子学与固体电子学，博士 （导师：曾晓洋教授）
卡尔斯鲁厄理工学院（德国），电子工程，联合培养博士 （导师：Prof. Mehdi Tahoori）
工作学术经历：
2024年09月 - 至今 复旦大学微电子学院，青年研究员
2022年02月 - 2024年08月 复旦大学微电子学院，博士后/助理研究员
人才称号：
上海市浦江人才 2022
学术兼职：
中国电子学会高级会员
中国宇航学会高级会员
中国计算机学会容错计算专委会执行委员
《智能安全》青年编委（军事科学院国防科技创新研究院主办）
《宇航学报》青年编委（中国宇航学会主办）
代表性成果
[1] Yan Li, Chao Chen, Xu Cheng, Jun Han, and Xiaoyang Zeng, “DMBF: Design Metrics Balancing Framework for Soft-Error-Tolerant Digital Circuits Through Bayesian Optimization,” IEEE Transactions on Circuits and Systems I: Regular Papers, pp. 4015–4027, 2023, doi: 10.1109/TCSI.2023.3302341.
[2] Yan Liu, Yan Li, Xu Cheng, Jun Han, and Xiaoyang Zeng, “A Non-Redundant Latch With Key-Node-Upset Obstacle of Beneficial Efficiency for Harsh Environments Applications,” IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 70, no. 4, pp. 1639–1648, Apr. 2023, doi: 10.1109/TCSI.2023.3237706.
[3] Chenyu Zhang, Yan Li, Xu Cheng, Jun Han, and Xiaoyang Zeng. “Impact of Tap Cell on Single Event Transient in 28-nm CMOS Technology.” 2022 European Conference on Radiation and its Effects on Components and Systems (RADECS), 2022.
[4] Chiyu Tan, Yan Li, Xu Cheng, Jun Han, and Xiaoyang Zeng. “Pulse Quenching Effect Characterized by Inverter Chains under Heavy-ion Irradiation in 28-nm CMOS Technology.” 2022 European Conference on Radiation and its Effects on Components and Systems (RADECS), 2022.
[5] Chiyu Tan, Yan Li, Xu Cheng, Jun Han, and Xiaoyang Zeng, “General Efficient TMR for Combinational Circuit Hardening Against Soft Errors and Improved Multi-Objective Optimization Framework,” IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), vol. 68, no. 7, pp. 3044–3057, Jul. 2021.
[6] Yan Li, Jun Han, Xiaoyang Zeng, and Mehdi B. Tahoori, “TRIGON: A Single-phase-clocking Low Power Hardened Flip-Flop with Tolerance to Double-Node-Upset for Harsh Environments Applications,” in 2021 Design, Automation Test in Europe Conference Exhibition (DATE), Feb. 2021.
[7] Yan Li, Xiaoyoung Zeng, Zhengqi Gao, Liyu Lin, Jun Tao, Jun Han, Xu Cheng, Mehdi B. Tahoori, and Xiaoyang Zeng. “Exploring a Bayesian Optimization Framework Compatible with Digital Standard Flow for Soft-Error-Tolerant Circuit,” in 2020 57th ACM/IEEE Design Automation Conference (DAC), Jul. 2020.
[8] Yan Li, Xu Cheng, Chiyu Tan, Jun Han, Yuanfu Zhao, Liang Wang, Tongde Li, Mehdi B. Tahoori, and Xiaoyang Zeng, “A Robust Hardened Latch Featuring Tolerance to Double-Node-Upset in 28nm CMOS for Spaceborne Application,” IEEE Transactions on Circuits and Systems II: Express Briefs (TCAS-II), vol. 67, no. 9, pp. 1619–1623, Sep. 2020.
[9] Yan Li, Jun Han, XiaoyoungZeng, and Xiaoyang Zeng. “A Multi-Objective Optimization Framework to Design Soft-Error-Immune Circuit.” 2019 European Conference on Radiation and its Effects on Components and Systems(RADECS), 2019.
