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陶俊

副教授硕士生导师

电话51355381

邮箱taojun@fudan.edu.cn

地址复旦大学张江校区微电子楼317室

研究所设计自动化研究所

个人网站 http://homepage.fudan.edu.cn/taojun/

个人简介:

复旦大学微电子学院副教授,IEEE高级会员。主要研究方向为集成电路计算机辅助设计,包括统计数据分析及系统优化等。已在本领域的权威国际期刊和会议IEEE Trans. on CAD、IEEE Trans. on VLSI、DAC、ICCAD等上发表论文40余篇。多次承担/参与国家自然科学基金、国家十一五/十二五科技重大专项等。目前担任IEEE Technical Committee on Very Large Scale Integration (TCVLSI) Newsletter副主编,国际学术会议IEEE ASPDAC 2019, DVCon China 2018-2019、ICCD 2012、TAU 2011等技术委员会成员,以及国际学术期刊IEEE Trans. on CAD、IEEE Trans. on VLSI、ACM Trans. on DAES,国际会议DAC、ICCAD等审稿人。


研究方向:

统计数据分析

混合信号系统优化

集成电路自动化设计

生物芯片设计与测试


教育及学术经历:

2016年-至今复旦大学微电子学院副教授

2012年-2013年美国卡内基梅隆大学电子计算机工程系访问学者

2008年-2015年复旦大学微电子学院讲师

2007年复旦大学微电子学系博士


学术任职:

IEEE Senior Member (IEEE高级会员)

IEEE Council on Electronic Design Automation (CEDA) 上海分会主席


代表性论文:

Jun Tao, Yangfeng Su, Dian Zhou, Xuan Zeng and Xin Li, “Graph-Constrained Sparse Performance Modeling for Analog Circuit Optimization via SDP Relaxation,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2018.

Xiaoxue Sun, Chenyang Kong, Yingyu Chen, Jun Tao*, Zhangwen Tang*, “A Synthesizable Constant Tuning Gain Technique for Wideband LC-VCO Design,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2018.

Jun Tao, Zhengqi Gao, Dian Zhou and Xuan Zeng*, “Efficient Statistical Analysis for Correlated Rare Failure Events,” IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), 2018. (Invited Talk)

Jun Tao, Handi Yu, Yangfeng Su, Dian Zhou*, Xuan Zeng* and Xin Li*, "Correlated Rare Failure Analysis via Asymptotic Probability Evaluation," IEEE Design Automation Conference (DAC), 2017.

Changhai Liao, Jun Tao*, Handi Yu, Zhangwen Tang, Yangfeng Su, Dian Zhou, Xuan Zeng*, Xin Li, “Efficient hybrid performance modeling for analog circuits using hierarchical shrinkage priors,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 35, no. 12, pp. 2148-2152, 2016.

Handi Yu, Jun Tao*, Changhai Liao, Yangfeng Su, Dian Zhou, Xuan Zeng* and Xin Li, “Efficient statistical analysis for correlated rare failure events via asymptotic probability approximation,” IEEE International Conference on Computer Aided Design (ICCAD), 2016.